Alcance
This document defines a conceptual schema for observations, for features involved in the observation process, and for features involved in sampling when making observations. These provide models for the exchange of information describing observation acts and their results, both within and between different scientific and technical communities.Observations commonly involve sampling of an ultimate feature-of-interest. This document defines a common set of sample types according to their spatial, material (for ex situ observations) or statistical nature. The schema includes relationships between sample features (sub-sampling, derived samples).This document concerns only externally visible interfaces and places no restriction on the underlying implementations other than what is needed to satisfy the interface specifications in the actual situation.