ISO 23729:2022

Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Autor: ISO
Código ICS: 71.040.40
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This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

Especificaciones de la Norma
Fecha de Publicación 13/07/2022
Título Secundario Analyse chimique des surfaces — Microscopie à force atomique — Lignes directrices relatives au mode opératoire de restauration des images de microscopie à force atomique dilatées par la taille finie de la sonde
Páginas Técnicas 15
Idioma Inglés